Rigi-Regi: Rigid Registration for Atomic Resolution Electron Microscopy
Step 2: View Image Stack
3. Filtered FFT + Cross correlation
Cutout
Fit Model
4. Shift matrices

Measured Shifts (X / Y)

Correction:

Masked Shifts (Outliers Black) (X / Y)

Corrected Shifts (X / Y)

Aligned Stack

Shift Trajectory

Summed Image Analysis

Real Space

FFT Magnitude